Development of a new method for corrected measured point determination in the CMM scanning process

Aim of project
New-generation CMM scanning probes determine sequences of measured points without losing contact with the real surface to be measured. Scanning offers new and effective possibilities for measurements. It allows to check not only dimensions, but also positioning and shape in a single setup, thus providing considerable reduction of time and of the number of measurement tasks.

According to some initial trials of scanning measurement using stylus tip radius correction built-in CMM software, it has been found that CMM software does not measure stylus tip radius well. As a result, information about the real shape of the measured features can be distorted.

In order to measure accurately by CMM, a new algorithm will be proposed for corrected measured point determination in the CMM scanning process. The new algorithm will be dedicated to “high definition coordinate metrology” (HDCM). High definition is here defined as a condition in which points are taken with a density (points per scanned distance) ensuring that successive tip positions overlap partially with each other. The development of this new method opens new possibilities of surface reconstruction from coordinate measurement data in HDCM.

Expected results
New method for corrected measured point determination in coordinate scanning measurement and trial version of software with the developed method;

Method of investigation of probe radius correction accuracy of specific CMM software in scanning measurements.